[1] John G E,Mitral V,Gerald S B,et al. High power diode laser arrays. IEEE Journal of Quantum Electronics,1992,28(4): 952~965
[2] Guo L,Yao J Q,Yu G J,et al. Acta Photonica Sinica,2004,33(9): 1025~1028
[3] Yang H R,Zuo T C H. Acta Photonica Sinica,2003,32(8): 907~910
[4] Gao H H,Lin S M,Kang X J,et al. Acta Photonica Sinica,1997,26(6): 522~526
[5] Jason C,David S,Jerry R. Temperature dependence of optical wavelength shift as a validation technique for technique for pulsed laser diode array thermal modeling.Proceeding of IEEE Semiconductor Thermal Measurement & Management Symposium,2003: 357~363
[6] Pernas R,Sanchez M,Pena-Sierra R,et al. A new method to determine the thermal resistance in semiconductor lasers. 4th IEEE International Caracas Conference on Devices,Circuits and Systems,2002,(4): 17~19
[7] Abdelkader H I,Hausien H H,Martin J D. Temperature rise and thermal rise-time measurement of a semiconductor laser diode. J Rev Sci Instrum,1992,63(3): 2004~2007
[8] Voss M,Lier C,Menzel U,et al. Time-resolved emission studies of GaAs/AlGaAs laser diode arrays on different heat sinks. J Appl Phys,1996,79(2): 1170~1172
[9] Group of testing feeble signal. Physics,1994,8(2): 154~160