• Acta Photonica Sinica
  • Vol. 35, Issue 8, 1142 (2006)
Chen Chen, Xin Guofeng*, Liu Rui, Qu Ronghui, and Fang Zujie
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    Chen Chen, Xin Guofeng, Liu Rui, Qu Ronghui, Fang Zujie. Measurement of Thermal Relaxation Time of Semiconductor Lasers[J]. Acta Photonica Sinica, 2006, 35(8): 1142 Copy Citation Text show less

    Abstract

    Based on the theory of lasing wavelength red shifting of semiconductor laser due to junction temperature rising in pulsed operation,the time-resolved spectrum was measured by means of scanning optical power during the pulse at different wavelengths with a Boxcar. The thermal relaxation time was calculated by the measured relation of peak moment of optical signal within the pulse varied with wavelength. A pulse semiconductor laser was measured,and the thermal relaxation time was obtained to be 1.2 ms.
    Chen Chen, Xin Guofeng, Liu Rui, Qu Ronghui, Fang Zujie. Measurement of Thermal Relaxation Time of Semiconductor Lasers[J]. Acta Photonica Sinica, 2006, 35(8): 1142
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