• INFRARED
  • Vol. 42, Issue 12, 21 (2021)
Yuan NIE* and Qian LI
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1672-8785.2021.12.004 Cite this Article
    NIE Yuan, LI Qian. Research on Reutilization Technology of CdZnTe Substrate[J]. INFRARED, 2021, 42(12): 21 Copy Citation Text show less
    References

    [4] Bostrup G. LPE HgCdTe on Sapphire Status and Advancements[J]. Journal of Electronic Materials, 2001, 30(6): 560565.

    [5] Varavin V S. HgCdTe Epilayers on GaAs: Growth and Devices[J]. OptoElectronics Review, 2003, 11(2): 99 111.

    [6] Zanatta J P. Heteroepitaxy of HgCdTe (211)B on Ge Substrates by Molecular Beam Epitaxy for Infrared Detectors[J]. Journal of Electronic Materials, 1998, 27(6): 542545.

    [7] Singh R, Velicu S, Crocco J, et al. Molecular Beam Epitaxy Growth of High-Quality HgCdTe LWIR Layers on Polished and Repolished CdZnTe Substrates[J]. Journal of Electronic Materials, 2005, 34(6): 885810.

    [8] LucTissot J, Marion F. Collective Flip Chip Technology for Hybrid Focal Plane Array[C]. SPIE, 2000, 4310: 581586.

    NIE Yuan, LI Qian. Research on Reutilization Technology of CdZnTe Substrate[J]. INFRARED, 2021, 42(12): 21
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