• Chinese Journal of Quantum Electronics
  • Vol. 18, Issue 3, 221 (2001)
[in Chinese], [in Chinese], [in Chinese], and [in Chinese]
Author Affiliations
  • [in Chinese]
  • show less
    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Self-collimation Method for Measuring the GeometricParameters of Solid Immersion Lens[J]. Chinese Journal of Quantum Electronics, 2001, 18(3): 221 Copy Citation Text show less
    References

    [1] Mansfield S M,Kino G S. Solid immersion microscope [J]. Appl. Phys. Lett.,1990,57(24): 2815~2816

    [2] Motoyoshi et al. Application of solid immersion lens to submicron resolution imaging of nano-scale quantum wells[J]. Optical Review,1999,6(3): 257~260

    [3] Koyama kazuko,Yoshita Masahiro,Baba Motoyoshi et al. High collection efficiency in fluorescence microscopywith a solid immersion lens [J]. Appl. Phys. Lett.,1999,75(12): 1667~1669

    [4] Milster T D,Hirota J s Jo. Roles of propagating and evanescent waves in solid immersion lens systems [J]. Appl.Opt.,1999,a8(2a): 5046

    [5] Joshua S jo,Milster T D,Erwin J K. Characteristic of gap-induced aberration in solid immersion lens systems.2000 Optical Data Storage [M]. British Columbia,Canada: Chateau Whistler Resort,2000. 14~17

    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Self-collimation Method for Measuring the GeometricParameters of Solid Immersion Lens[J]. Chinese Journal of Quantum Electronics, 2001, 18(3): 221
    Download Citation