• Acta Photonica Sinica
  • Vol. 34, Issue 9, 1431 (2005)
[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A Study on the Multiplication Technique of Nano-moiré Fringe[J]. Acta Photonica Sinica, 2005, 34(9): 1431 Copy Citation Text show less

    Abstract

    A nano-moiré fringe multiplication method is proposed and used to measure nano-deformation of single crystal materials.The lattice structure of single crystal materials is captured by TEM(Transmission Electron Microscope) and acted as a specimen grating.An unidirectional grating fabricated on glass or film is selected as a reference grating.The formation principles of TEM nano-moiré fringe,the relationship between TEM magnification and grating frequency,as well as displacement and strain measurement method ......
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A Study on the Multiplication Technique of Nano-moiré Fringe[J]. Acta Photonica Sinica, 2005, 34(9): 1431
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