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    Journals >Acta Optica Sinica >Volume 30 >Issue 10 >Page 3044 > Article
    • Acta Optica Sinica
    • Vol. 30, Issue 10, 3044 (2010)
    Reliability Assessment of Superluminescent Diodes from Performance Degradation Data
    Chao Daihong*, Ma Jing, and Zhang Chunxi
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    DOI: 10.3788/aos20103010.3044 Cite this Article Set citation alerts
    Chao Daihong, Ma Jing, Zhang Chunxi. Reliability Assessment of Superluminescent Diodes from Performance Degradation Data[J]. Acta Optica Sinica, 2010, 30(10): 3044 Copy Citation Text show less
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    Chao Daihong, Ma Jing, Zhang Chunxi. Reliability Assessment of Superluminescent Diodes from Performance Degradation Data[J]. Acta Optica Sinica, 2010, 30(10): 3044
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