Journals
Advanced Photonics
Photonics Insights
Advanced Photonics Nexus
Photonics Research
Advanced Imaging
View All Journals
Chinese Optics Letters
High Power Laser Science and Engineering
Articles
Optics
Physics
Geography
View All Subjects
Conferences
CIOP
HPLSE
AP
View All Events
News
About CLP
Search by keywords or author
Login
Registration
Login in
Registration
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
metasurface
laser
polarization
nir
lithium niobate
optical coherence tomography
Journals >
Acta Optica Sinica >
Volume 30 >
Issue 10 >
Page 3044 > Article
Acta Optica Sinica
Vol. 30, Issue 10, 3044 (2010)
Reliability Assessment of Superluminescent Diodes from Performance Degradation Data
Chao Daihong
*
, Ma Jing, and Zhang Chunxi
Author Affiliations
[in Chinese]
show less
DOI:
10.3788/aos20103010.3044
Cite this Article
Set citation alerts
Chao Daihong, Ma Jing, Zhang Chunxi. Reliability Assessment of Superluminescent Diodes from Performance Degradation Data[J]. Acta Optica Sinica, 2010, 30(10): 3044
Copy Citation Text
EndNote(RIS)
BibTex
Plain Text
show less
Cited By
Article index updated: May. 19, 2024
Citation counts are provided from Researching.
The article is cited by
1
article(s) from Researching.
Abstract
Get PDF(in Chinese)
Figures&Tables (0)
Equations (0)
References (12)
Cited By (1)
Get Citation
Copy Citation Text
Chao Daihong, Ma Jing, Zhang Chunxi. Reliability Assessment of Superluminescent Diodes from Performance Degradation Data[J]. Acta Optica Sinica, 2010, 30(10): 3044
Download Citation
EndNote(RIS)
BibTex
Plain Text
Set citation alerts for the article
Tools
Share
Set citation alerts for the article
Save the article for my favorites
Paper Information
Category: Optical Devices
Received: Jan. 12, 2010
Accepted: --
Published Online: --
The Author Email: Daihong Chao (daihongchao@vip.sina.com)
DOI:
10.3788/aos20103010.3044
Recommended Topics
laser devices and laser physics
Lasers and Laser Optics
Laser physics
laser manufacturing
Instrumentation, Measurement and Metrology
Set citation alerts for the article
Please enter your email address
Cancel
Confirm