• Journal of Infrared and Millimeter Waves
  • Vol. 29, Issue 1, 15 (2010)
GE Xin-Hao*, LV Mo, ZHONG Hua, and ZHANG Cun-Lin
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    GE Xin-Hao, LV Mo, ZHONG Hua, ZHANG Cun-Lin. TERAHERTZ WAVE REFLECTION IMAGING SYSTEM BASED ON BACKWARD WAVE OSCILLATOR AND ITS APPLICATION[J]. Journal of Infrared and Millimeter Waves, 2010, 29(1): 15 Copy Citation Text show less

    Abstract

    A terahertz (THz) wave reflection imaging system based on backward wave oscillator (BWO) was presented. It is a new approach to non-destructive testing. The intensity information of the terahertz wave after being reflected from the sample surface or substrate was collected by a pyroelectric detector, and then imaged by computer. A number of samples which had potential imaging applications were tested by using 0.7 THz radiation, including coins, badges, a model air-plane and some industrial samples that contained pre-built defects. The experimental results reveal that THz radiation is highly transparent to many industrial materials, especially the “microwave-absorbing” material which is widely used in aero and space technologies.
    GE Xin-Hao, LV Mo, ZHONG Hua, ZHANG Cun-Lin. TERAHERTZ WAVE REFLECTION IMAGING SYSTEM BASED ON BACKWARD WAVE OSCILLATOR AND ITS APPLICATION[J]. Journal of Infrared and Millimeter Waves, 2010, 29(1): 15
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