• Infrared and Laser Engineering
  • Vol. 33, Issue 5, 445 (2004)
[in Chinese]*, [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese]. Measurement method for MRTD of infrared imaging system[J]. Infrared and Laser Engineering, 2004, 33(5): 445 Copy Citation Text show less
    References

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    [9] Richard Vollmerhausen, Ronald G Driggers, Barbara L O′Kane. Influence of sampling on target recognition and identification[J]. Opt Eng,1999,38(5):763-772.

    [11] Piet Bijl,Maarten A Hogervorst, Mathieu Valeton J.TOD, NVTherm and TRM3 model calculations:a comparison[A]. SPIE[C]. 2002,4719.51-62.

    [in Chinese], [in Chinese], [in Chinese]. Measurement method for MRTD of infrared imaging system[J]. Infrared and Laser Engineering, 2004, 33(5): 445
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