• Journal of Infrared and Millimeter Waves
  • Vol. 28, Issue 6, 410 (2009)
LI Wen-Wu1,2, LI Ya-Wei1,2, HU Zhi-Gao1,2,*, ZHU Zi-Qiang1, and CHU Jun-Hao1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    LI Wen-Wu, LI Ya-Wei, HU Zhi-Gao, ZHU Zi-Qiang, CHU Jun-Hao. STUDY ON THE SPECTROSCOPIC ELLIPSOMETRY OF La0.5Sr0.5CoO3 FILMS PREPARED AT DIFFERENT SUBSTRATE TEMPERATURES[J]. Journal of Infrared and Millimeter Waves, 2009, 28(6): 410 Copy Citation Text show less
    References

    [1] Lee Jang-Sik, Kang B S, JiaQ X. Data retention characteristics of Bi3. 25La0.75Ti3O12thin films on conductive SrRuO3 electrodes [J].App1. Phys. Lett.,2007,91(142901): 1—3.

    [2] Mantese Joseph V, MicheliAdolph L, Catalan Antonio B, et al.Formation of lanthanum strontium cobalt thin films by metalorganic decomposition[J].Appl. Phys. Lett.,1994, 64(25): 3509—3511.

    [3] JainM, Karan N K, Yoon J,et al.High tunability of lead strontium titanate thin filmsusing a conductiveLaNiO3 as electrodes[J].Appl. Phys. Lett.,2007,91(07):2908—2910.

    [4] WuW B, WongKH, Choy C L,et al.Top-interface-controlled fatigue of epitaxial Pb(Zr0.52Ti0.48)O3ferroelectric thin films on La0.7Sr0.3MnO3electrodes[J].Appl. Phys. Lett.,2000,77(21): 3441—3443.

    [5] WangG S, Hu Z G, Huang Z M,et al.Infrared optical properties ofPbZr0.4Ti0.6O3/La0.5Sr0.5CoO3heterostructures on platinized silicon substrate[J].Appl. Phys. A,2004,78(1): 119—123.

    [6] Chen X, Wu N J, RitumsD L,et al.Pulsed laser deposition of conducting porous La-Sr-Co-O films[J].Thin Solid Films,1999,342(1-2): 61—66.

    [7] Ramesh R, GilchristH, Sands T,et al.Ferroelectric LaSr-Co-O/Pb-Zr-Ti-O/La-Sr-Co-O heterostructures on silicon via template growth[J].Appl. Phys. Lett.,1993,63(26): 3592—3594.

    [8] Cheung JeffreyT, Morgan PeterE D, Lowndes Douglas H, et al.Structural and electrical properties ofLa0.5Sr0.5CoO3 epitaxial films[J].Appl. Phys. Lett.,1993,62(17):2045—2047.

    [9] Azzam R M A, Bashara N M.Ellipsometry and Polarized Light[M].Amsterdam: Elsevier,1977, 181.

    [10] Hu Z G, Huang ZM, WuY N,etal.Ellipsometric characterization of LaNiO3-xfilms grown on Si(111) substrates: Effects of oxygen partial pressure[J].J. Appl. Phys.,2004,95(8): 4036—4041.

    [11] Huang Zhiming, Meng Xiangjian, Yang Pingxiong,et al. Opticalproperties ofPbZrxTi1-xO3on platinized silicon by infrared spectroscopic ellipsometry[J].Appl. Phys. Lett., 2000,76(26): 3980—3982.

    [12] Palik E D.Handbook ofOpticalConstants ofSolids[M]. Orlando:Academic,1985, 341.

    LI Wen-Wu, LI Ya-Wei, HU Zhi-Gao, ZHU Zi-Qiang, CHU Jun-Hao. STUDY ON THE SPECTROSCOPIC ELLIPSOMETRY OF La0.5Sr0.5CoO3 FILMS PREPARED AT DIFFERENT SUBSTRATE TEMPERATURES[J]. Journal of Infrared and Millimeter Waves, 2009, 28(6): 410
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