[1] Nayar S K, Nakagawa Y. Shape from focus[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 16, 824-831(1994).
[2] Lin X, Suo J L, Wetzstein G et al. Coded focal stack photography. [C]//IEEE International Conference on Computational Photography (ICCP), April 19-21, 2013, Cambridge, MA, USA. New York: IEEE, 13580200(2013).
[3] Chang J H R, Sankaranarayanan A C. Towards multifocal displays with dense focal stacks[J]. ACM Transactions on Graphics, 37, 198(2019).
[4] Miau D, Cossairt O, Nayar S K. Focal sweep videography with deformable optics. [C]//IEEE International Conference on Computational Photography (ICCP), April 19-21, 2013, Cambridge, MA, USA. New York: IEEE, 13580204(2013).
[5] Liu C, Qiu J, Jiang M. Light field reconstruction from projection modeling of focal stack[J]. Optics Express, 25, 11377-11388(2017).
[6] Takahashi K, Kobayashi Y, Fujii T. From focal stack to tensor light-field display[J]. IEEE Transactions on Image Processing, 27, 4571-4584(2018).
[7] Solh M. Real-time focal stack compositing for handheld mobile cameras[J]. Proceedings of SPIE, 9020, 90200Z(2014).
[8] Yeo T, Ong S, Sinniah R. Autofocusing for tissue microscopy[J]. Image and Vision Computing, 11, 629-639(1993).
[10] Aydin T, Akgul Y S. A new adaptive focus measure for shape from focus[C]//Procedings of the British Machine Vision Conference 2008, September 2008, Leeds, UK.(2008).
[14] Hasinoff S W, Kutulakos K N. Light-efficient photography[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 33, 2203-2214(2011).
[15] Choi D, Pazylbekova A, Zhou W H et al. Improved image selection for focus stacking in digital photography. [C]//2017 IEEE International Conference on Image Processing (ICIP), September 17-20, 2017, Beijing, China, New York: IEEE, 2761-2765(2017).
[16] Levin A, Lischinski D, Weiss Y. A closed-form solution to natural image matting[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 30, 228-242(2008).
[17] Yu L S, Shen D Y. A refinement of the scan line seed fill algorithm[J]. Computer Engineering, 29, 70-72(2003).
[18] Du J, Zheng Y G, Li M[J]. A modified scan line seed fill algorithm Information Technology and Informatization, 2007, 79-80.
[19] Rudin L I, Osher S, Fatemi E. Nonlinear total variation based noise removal algorithms[J]. Physica D: Nonlinear Phenomena, 60, 259-268(1992).