Measurement of grating thickness with power spectrum

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 31 >Issue 5 >Page 46 > Article

Opto-Electronic Engineering
Vol. 31, Issue 5, 46 (2004)

Measurement of grating thickness with power spectrum

[in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of grating thickness with power spectrum[J]. Opto-Electronic Engineering, 2004, 31(5): 46 Copy Citation Text

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[1] Liu Honglin, Wu Han, Zou Yuanping, Zhang Zaixuan. Cascaded Stimulated Brillouin Scattering in Three-Wavelength Fiber Raman Amplifier[J]. Chinese Journal of Lasers, 2010, 37(12): 3050

[2] WANG Yu-zhi, AI Hua, HAN Xu-dong. Extraction of Moiré Fringe Signal for Photoelectric Encoder Based on Grating Self-imaging[J]. Opto-Electronic Engineering, 2009, 36(1): 78

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of grating thickness with power spectrum[J]. Opto-Electronic Engineering, 2004, 31(5): 46

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