• Opto-Electronic Engineering
  • Vol. 31, Issue 5, 46 (2004)
[in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of grating thickness with power spectrum[J]. Opto-Electronic Engineering, 2004, 31(5): 46 Copy Citation Text show less

    Abstract

    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of grating thickness with power spectrum[J]. Opto-Electronic Engineering, 2004, 31(5): 46
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