• Acta Optica Sinica
  • Vol. 37, Issue 8, 0822002 (2017)
Shihuan Shen, Yanqiu Li*, Jiahua Jiang, Yan Liu, Ke Liu, and Lihui Liu
Author Affiliations
  • Key Laboratory of Photoelectronic Imaging Technology and System, Ministry of Education, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China
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    DOI: 10.3788/AOS201737.0822002 Cite this Article Set citation alerts
    Shihuan Shen, Yanqiu Li, Jiahua Jiang, Yan Liu, Ke Liu, Lihui Liu. Graded Multilayer Film Design for Anamorphic Magnification EUV Lithographic Objective[J]. Acta Optica Sinica, 2017, 37(8): 0822002 Copy Citation Text show less
    Schematic of Mo/Si multilayer films. (a) Normalized multilayer film; (b) laterally graded multilayer film; (c) depth graded multilayer film
    Fig. 1. Schematic of Mo/Si multilayer films. (a) Normalized multilayer film; (b) laterally graded multilayer film; (c) depth graded multilayer film
    Flow chart of laterally and depth graded multilayers combined method
    Fig. 2. Flow chart of laterally and depth graded multilayers combined method
    Layout of objective
    Fig. 3. Layout of objective
    Off-axis image field and F1-F15 field points
    Fig. 4. Off-axis image field and F1-F15 field points
    Reflectivity versus incidence angle of normalized multilayer film for mirrors.(a) M1~M3; (b) M4~M6
    Fig. 5. Reflectivity versus incidence angle of normalized multilayer film for mirrors.(a) M1~M3; (b) M4~M6
    Reflectivity distribution of mirrors with coating (M1~M6) in the center of the field of view F2
    Fig. 6. Reflectivity distribution of mirrors with coating (M1~M6) in the center of the field of view F2
    Reflectivity distribution and wavefront aberration distribution of the system. (a) F2, reflectivity; (b) F15, reflectivity; (c) F2, wavefront aberration; (d) F15, wavefront aberration
    Fig. 7. Reflectivity distribution and wavefront aberration distribution of the system. (a) F2, reflectivity; (b) F15, reflectivity; (c) F2, wavefront aberration; (d) F15, wavefront aberration
    Thickness distribution of mirrors M2 and M3 depth graded multilayer films. (a) M2; (b) M3
    Fig. 8. Thickness distribution of mirrors M2 and M3 depth graded multilayer films. (a) M2; (b) M3
    Reflectivity versus incidence angle of depth graded multilayer film for mirrors M2 and M3
    Fig. 9. Reflectivity versus incidence angle of depth graded multilayer film for mirrors M2 and M3
    Reflectivity distribution of mirrors M2 and M3. (a) M2; (b) M3
    Fig. 10. Reflectivity distribution of mirrors M2 and M3. (a) M2; (b) M3
    Reflectivity distribution and wavefront aberration distribution of the system. (a) F2, reflectivity; (b) F15, reflectivity; (c) F2, wavefront aberration; (d) F15, wavefront aberration
    Fig. 11. Reflectivity distribution and wavefront aberration distribution of the system. (a) F2, reflectivity; (b) F15, reflectivity; (c) F2, wavefront aberration; (d) F15, wavefront aberration
    ItemValue
    Wavelength/nm13.5
    NA0.50
    Magnification4×8
    Exposure field at wafer /mm26×0.25
    Table 1. Main design specifications of projective objective
    ParameterM1M2M3M4M5M6
    Diameter /mm249.05108.6263.90201.17145.69341.39
    Average incident angle /(°)14.1224.7611.365.2310.103.62
    Incident angle range /(°)10.37-19.3716.62-33.604.62-16.812.54-7.660.93-16.670.29-5.98
    Table 2. Incident angles of projection objective system
    MirrorC0C2Y0
    M11.0081.025×-670.86
    M21.0582.259×10-549.06
    M31.066-1.800×10-6-120.90
    M50.9941.773×10-6-9.27
    Table 3. Gradient parameters of laterally graded multilayer films
    System without coatingSystem with coating
    Field pointWavefront aberration /λStrehl ratioWavefront aberration /λStrehl ratio
    F20.03630.9410.07120.819
    F150.06490.8470.06450.848
    Table 4. Wavefront aberration and Strehl ratio of the systems without coating and with coating
    Shihuan Shen, Yanqiu Li, Jiahua Jiang, Yan Liu, Ke Liu, Lihui Liu. Graded Multilayer Film Design for Anamorphic Magnification EUV Lithographic Objective[J]. Acta Optica Sinica, 2017, 37(8): 0822002
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