Author Affiliations
1College of Automation and Information Engineering, Xi'an University of Technology, Xi'an 710048, Shaanxi, China2Shaanxi Key Laboratory of Complex System Control and Intelligent Information Processing, Xi'an University of Technology, Xi'an 710048, Shaanxi, Chinashow less
Fig. 1. Band gap energy and laser wavelength of GaInP materials with different Ga mole fractions. (a) Band gap energy; (b) laser wavelength
Fig. 2. Coefficients A and B for GaInP materials with different Ga mole fractions
Fig. 3. Lattice constants of different materials. (a) SiGe; (b) GaInP, AlInP; (c) AlGaInP
Fig. 4. Expansion coefficients of SiGe and GaInP materials. (a) SiGe; (b) GaInP
Fig. 5. Variation curve of different lattice constants with temperature
Fig. 6. Optical power and conversion efficiency of 640 nm semiconductor laser
Fig. 7. Output characteristics of 620 nm semiconductor laser on Ge/SixGe1-x substrate
Fig. 8. Variation curve of Ga0.57In0.43P band gap with temperature
Fig. 9. Output characteristics of different quantum well structures
Fig. 10. Peak gain and I-P curve for five structures. (a) Peak gain; (b) I-P curve
Material | Si | Ge | GaP | InP | AlP |
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Lattice constants /nm | 0.5431 | 0.5658 | 0.5451 | 0.5869 | 0.5464 |
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Table 1. Lattice constants of Si, Ge, GaP, InP and AlP materials
Material | Si | Ge | GaP | InP | AlP |
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α /K-1 | 2.60×10-6 | 5.91×10-6 | 9.16×10-7 | 5.05×10-6 | 9.16×10-7 |
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Table 2. Expansion coefficients α for Si, Ge, GaP, InP and AlP
Material | Ge | Si0.12Ge0.88 | Ga0.57In0.43P | Al0.588In0.412P | Al0.180Ga0.395In0.425P |
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α /K-1 | 5.91×10-6 | 5.51×10-6 | 2.69×10-6 | 2.62×10-6 | 2.67×10-6 |
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Table 3. Expansion coefficients of materials
Structure | 1 | 2 | 3 | 4 |
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Mole fraction of Ga | 0.55 | 0.56 | 0.57 | 0.58 | Lattice constant /nm | 0.5638 | 0.5634 | 0.5630 | 0.5626 | QW thickness /nm | 4 | 5.2 | 7 | 10 | Threshold current /A | 0.77 | 0.67 | 0.58 | 0.62 | Conversion efficiency /% | 28.1 | 34.4 | 38.3 | 37.3 |
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Table 4. Parameters and output characteristics of different GaInP quantum wells
Structure | 1 | 2 | 3 | 4 | 5 |
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Mole fraction of Si | 0.08 | 0.1 | 0.12 | 0.16 | 0.18 | QW strain /% | 0.16(tensile) | 0.09(tensile) | 0 | 0.16(compressive) | 0.23(compressive) | QW thickness /nm | 5.6 | 6.2 | 7 | 9.5 | 10 | Peak gain /cm-1 | 3127 | 3230 | 4035 | 3141 | 3149 | Threshold current /A | 0.68 | 0.64 | 0.58 | 0.61 | 0.65 | Conversion efficiency /% | 32.1 | 35.2 | 38.3 | 37.1 | 34.4 |
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Table 5. Simulation results for different QW strain structures