Fast Image Dehazing Based on Dark-chanel Physical Model

FU Hui; WU Bin; ZHANG Hongying; XU Jin

doi:10.3969/j.issn.1003-501x.2016.02.014

[1] Tan R. Visibility in bad weather from a single image [C]// Proceedings of IEEE Conference on Computer Vision and Pattern Recognition，Washington DC，USA，Jun 23-28，2008：2347-2354.

[2] Fattal R. Single image de-hazing [J]. ACM Transactions on Graphics(S0730-0301)，2008，27(3)：721-729.

[3] Tarel J P，Hautiere N. Fast visibility restoration from a single color or gray level image [C]// Proceedings of the 12th IEEE International Conference on Computer Vision，Kyoto，Japan，Sep 29-Oct 2，2009：2201–2208.

[4] Kopf J，Neubert B，Chen B，et al. Deep photo：model-based photograph enhancement and viewing [J]. ACM Transition Graph(S1557-7368)，2008，27(5)：116-1-116-10.

[5] Schechner Y Y，Narasimhan S G，Nayar S K. Instant de-hazing of images using polarization [C]// Proceedings of IEEE Conference on Computer Vision and Pattern Recognition，Hawaii，USA，Dec 9-14，2001，1：325-332.

[6] Narasimhan S G，Nayar S K. Vision and the atmosphere [J]. International Journal of Computer Vision(S0920-5961)，2002， 48(3)：233-254.

[7] HE Kaiming，SUN Jian，TANG Xiaoou. Single image haze removal using dark channel prior [C]// Proceedings of IEEE Conference on Computer Vision and Pattern Recognition，Washington D C，USA，Jun 20-25，2009：1956-1963.

[8] JIANG Shuming，DUAN Caiyan. An improved partition image restoration based on Wiener Filter [J]. Shandong Science， 2012，25(4)：40-46.

[9] WANG Baoyun，ZHANG Rong，YIN Dong，et al. A Blurriness assessment method based on maximal oriented gradient [J]. Opto-Electronic Engineering，2013，40(5)：80-86.

[10] ZOU Yongxing，ZHOU Renkui，LUO Xiujuan，et al. New method for image target edge extraction [J]. Opto-Electronic Engineering，2005，32(6)：76-79.

[11] ZHANG Shangwei，ZENG Ping，LUO Xuemei，et al. Multi-Scale retinex with color restoration and detail compensation [J]. Academic Journal of Xi’an Jiaotong University，2012，46(4)：32-37.

[12] ZOU Jiangwei，CHEN Zengping. Small space target extraction based on morphology and image flow method [J]. Opto-Electronic Engineering，2005，32(4)：13-16.