Reliability Study of Grating Coupled Semiconductor Laser Based on Raman Spectra Technique

Jia Peng; Qin Li; Zhang Xing; Zhang Jian; Liu Tianyuan; Men Zhiwei; Ning Yongqiang

doi:10.3964/j.issn.1000-0593(2016)06-1745-04

Journals >Spectroscopy and Spectral Analysis >Volume 36 >Issue 6 >Page 1745 > Article

Spectroscopy and Spectral Analysis
Vol. 36, Issue 6, 1745 (2016)

Reliability Study of Grating Coupled Semiconductor Laser Based on Raman Spectra Technique

Jia Peng^1、2, Qin Li^1、*, Zhang Xing¹, Zhang Jian¹, Liu Tianyuan³, Men Zhiwei³, and Ning Yongqiang¹

Author Affiliations

¹[in Chinese]

²[in Chinese]

³[in Chinese]

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DOI: 10.3964/j.issn.1000-0593(2016)06-1745-04 Cite this Article

Jia Peng, Qin Li, Zhang Xing, Zhang Jian, Liu Tianyuan, Men Zhiwei, Ning Yongqiang. Reliability Study of Grating Coupled Semiconductor Laser Based on Raman Spectra Technique[J]. Spectroscopy and Spectral Analysis, 2016, 36(6): 1745 Copy Citation Text

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