• Spectroscopy and Spectral Analysis
  • Vol. 41, Issue 1, 32 (2021)
Tao YIN1、1, Zi-wei LIU1、1, Chen CAI1、1, and Zhi-mei QI1、1
Author Affiliations
  • 1[in Chinese]
  • 11. State Key Laboratory of Transducer Technology, Aerospace Information Research Institute, Chinese Academy of Sciences, Beijing 100190, China
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    DOI: 10.3964/j.issn.1000-0593(2021)01-0032-07 Cite this Article
    Tao YIN, Zi-wei LIU, Chen CAI, Zhi-mei QI. Determination of Surface Plasmon Resonance Wavelength by Combination of Radiation-Based Spectral Correction With Self-Adaptive Fitting[J]. Spectroscopy and Spectral Analysis, 2021, 41(1): 32 Copy Citation Text show less
    (a) Raw spectrum of light source obtained by standard instrument; (b) Relative power spectrum after radiation-based spectral correction; (c) Raw spectrum of light source obtained by SPR measurement system; (d) Relative instrument response function of SPR system
    Fig. 1. (a) Raw spectrum of light source obtained by standard instrument; (b) Relative power spectrum after radiation-based spectral correction; (c) Raw spectrum of light source obtained by SPR measurement system; (d) Relative instrument response function of SPR system
    (a) Raw SPR resonance spectrum and its radiation spectrum and corresponding fitting curve;(b) Relative reflectance curves of conventional correction method and our radiation-based method
    Fig. 2. (a) Raw SPR resonance spectrum and its radiation spectrum and corresponding fitting curve;(b) Relative reflectance curves of conventional correction method and our radiation-based method
    (a) SPR raw spectra under different incident angles; (b) corrected by radiation-based method; (c) corrected by conventional method
    Fig. 3. (a) SPR raw spectra under different incident angles; (b) corrected by radiation-based method; (c) corrected by conventional method
    Resonance wavelengths of 4 000 SPR spectra obtained continuously
    Fig. 4. Resonance wavelengths of 4 000 SPR spectra obtained continuously
    (a) SPR relative reflectance spectra at different concentrations corrected by radiation-based correction and (b) conventional correction; (c) Sensitivity curve of refractive index based on conventional correction (black) and radiation-based correction (red)
    Fig. 5. (a) SPR relative reflectance spectra at different concentrations corrected by radiation-based correction and (b) conventional correction; (c) Sensitivity curve of refractive index based on conventional correction (black) and radiation-based correction (red)
    (a) Reflectance spectra corrected by radiation-based method at different times during the adsorption; (b) Resonance wavelength shift versus adsorption time
    Fig. 6. (a) Reflectance spectra corrected by radiation-based method at different times during the adsorption; (b) Resonance wavelength shift versus adsorption time
    Tao YIN, Zi-wei LIU, Chen CAI, Zhi-mei QI. Determination of Surface Plasmon Resonance Wavelength by Combination of Radiation-Based Spectral Correction With Self-Adaptive Fitting[J]. Spectroscopy and Spectral Analysis, 2021, 41(1): 32
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