[1] E. Abbe, "Beitr ge zur Theorie des Mikroskops und der mikroskopischen Wahrnehmung," Archiv f€ur mikro. Ana. 9, 413–418 (1873).
[2] S. W. Hell, J. Wichmann, "Breaking the diffraction resolution limit by stimulated emission: Stimulatedemission– depletion fluorescence microscopy," Opt. Lett. 19, 780–782 (1994).
[3] T. A. Klar, S. W. Hell, "Subdiffraction resolution in far-field fluorescence microscopy," Opt. Lett. 24, 954– 956 (1999).
[4] M. G. L. Gustafsson, D. A. Agard, J. W. Sedat, "Doubling the lateral resolution of wide-field fluorescence microscopy using structured illumination," Proc. SPIE 3919, 141–150 (2000).
[5] M. G. L. Gustafsson, "Surpassing the lateral resolution limit by a factor of two using structured illumination microscopy," J. Microsc. Oxford 198, 82–87 (2000).
[6] E. Betzig, G. H. Patterson, R. Sougrat, O. W. Lindwasser, S. Olenych, J. S. Bonifacino,M.W. Davidson, J. Lippincott-Schwartz, H. F. Hess, "Imaging intracellular fluorescent proteins at nanometer resolution," Science 313, 1642–1645 (2006).
[7] M. J. Rust, M. Bates, X. Zhuang, "Sub-diffractionlimit imaging by stochastic optical reconstruction microscopy (STORM)," Nat. Methods 3, 793–796 (2006).
[8] K. Wicker, R. Heintzmann, "Single-shot optical sectioning using polarization-coded structured illumination," J. Optics UK 12, 084010 (2010).
[9] H. Huang, B. Chang, L. Chou, S. Chiang, "Threebeam interference with circular polarization for structured illumination microscopy," Opt. Express 21, 23963–23977 (2013).
[10] B. Harke, C. K. Ullal, J. Keller, S. W. Hell, "Threedimensional nanoscopy of colloidal crystals," Nano Lett. 8, 1309–1313 (2008).
[11] X. A. C. K. Yi, "A method for generating a threedimensional dark spot using a radially polarized beam," J. Optics-UK 13, 125704 (2011).
[12] T. J. Gould, J. R. Myers, J. Bewersdorf, "Total internal reflection STED microscopy," Opt. Express 19, 13351–13357 (2011).
[13] M. Leutenegger, C. Ringemann, T. Lasser, S.W. Hell, C. Eggeling, "Fluorescence correlation spectroscopy with a total internal reflection fluorescence STED microscope (TIRF-STED-FCS)," Opt. Express 20, 5243–5263 (2012).
[14] X. Hao, C. Kuang, T. Wang, X. Liu, "Effects of polarization on the de-excitation dark focal spot in STED microscopy," J. Optics UK 12, 115707 (2010).
[15] H. Zhang, M. Zhao, L. Peng, "Nonlinear structured illumination microscopy by surface plasmon enhanced stimulated emission depletion," Opt. Express 19, 24783–24794 (2011).
[16] F. Dake, S. Nakayama, Y. Taki, "Theoretical assessment of two-dimensional nonlinear structured illumination microscopy based on structured excitation and structured stimulated emission depletion," Opt. Rev. 22, 598–604 (2015).
[17] B. Richards, E. Wolf, "Electromagnetic diffraction in optical systems. II. Structure of the image field in an aplanatic system," Proceedings of the Royal Society of London A: Mathematical, Physical and Engineering Sciences 253, 358–379 (1959).
[18] B. R. Boruah, M. Neil, "Focal field computation of an arbitrarily polarized beam using fast Fourier transforms," Opt. Commun. 282, 4660–4667 (2009).