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    Journals >Acta Optica Sinica >Volume 7 >Issue 11 >Page 1029 > Article
    • Acta Optica Sinica
    • Vol. 7, Issue 11, 1029 (1987)
    Measurement of layer-thickness variation in the hardening process of adhesive by real-time holography
    WANG WENSHENG1 and B. PFISTER2
    Author Affiliations
  • 1[in Chinese]
  • 2Inst für Technische Optik,Univ. Stuttgart,West Germany
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    WANG WENSHENG, B. PFISTER. Measurement of layer-thickness variation in the hardening process of adhesive by real-time holography[J]. Acta Optica Sinica, 1987, 7(11): 1029 Copy Citation Text show less
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    WANG WENSHENG, B. PFISTER. Measurement of layer-thickness variation in the hardening process of adhesive by real-time holography[J]. Acta Optica Sinica, 1987, 7(11): 1029
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    Paper Information
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