[1] Shnidman D A. Radar detection in clutter [J]. IEEE Transactions on Aerospace and Electronic Systems (S0018-9251)，2005，41(3)：1056-1067.

[2] WANG Shou-yong，LIU Jun-kai，WANG Yong-liang. CFAR Detection for Multi-Class Clutter Distribution Based on Airborne Radar [J]. Acta Electronica Sinica，2005，33(3)：484-487.

[3] Smith M E，Varshney P K. Intelligent CFAR processor based on data variability [J]. IEEE Transactions on Aerospace and Electronic Systems(S0018-9251)，2000，36(3)：837-847.

[4] Stephens M A. EDF Statistics for Goodness of Fit and Some Comparisons [J]. Journal of the American Statistical Association(S0162-1459)，1974，69(347)：730-737.

[5] D'Agostino Ralph B，Stephens Michael A. Goodness-of-fit techniques [M]. New York：Dekker，1986.

[6] Scholz F W，Stephens M A. K-sample Anderson-Darling tests [J]. Journal of the American Statistical Association (S0162-1459)，1987，82(399)：918-924.

[7] Dong Y. Clutter spatial distribution and new approaches of parameter estimation for Weibull, and K-distributions. Research DSTO (DSTO-RR-0274), Australia [R]. 2004

[8] Haykin S，Bakker R，Currie B W. Uncovering nonlinear dynamics: the case study of sea clutter [J]. Proceedings of the IEEE(S0018-9219)，2002，90(5)：860-881.

[9] Kuruoglu E E，Zerubia J. Modeling SAR images with a generalization of the rayleigh distribution [J]. IEEE Transactions on Image Processing(S1057-7149)，2004，13(4)：527-533.

[10] Anastassopoulos V，Lampropoulos G A. Optimal CFAR detection in Weibull clutter [J]. IEEE Transactions on Aerospace and Electronic Systems(S0018-9251)，1995，31(1)：52-64.

[11] Bucciarelli T，Lombardo P，Tamburrini S. Optimum CFAR detection against compound Gaussian clutter with partially correlated texture [J]. IEE Proceedings Radar, Sonar and Navigation(S1350-2395)，1996，143(2)：95-104.

[12] Rohling H. Radar CFAR thresholding in clutter and multiple target situations [J]. IEEE Transactions on Aerospace and Electronic Systems(S0018-9251)，1983，AES-19(4)：608-621.

[13] De Maio A，Foglia G，Conte E，et al. CFAR behavior of adaptive detectors: an experimental analysis [J]. IEEE Transactions on Aerospace and Electronic Systems(S0018-9251)，2006，41(1)：233-251.