Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Acta Optica Sinica >Volume 33 >Issue 12 >Page 1211002 > Article
    • Acta Optica Sinica
    • Vol. 33, Issue 12, 1211002 (2013)
    Non-Uniformity Correction Method Based on Standard Deviation Value Compensation after Moment Matching
    Zhu Shanyou1、*, Zhang Guixin1, Gong Cailan2, Zhu Lingya3, He Huaying3, and Hu Yong2
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
    • show less
    DOI: 10.3788/aos201333.1211002 Cite this Article Set citation alerts
    Zhu Shanyou, Zhang Guixin, Gong Cailan, Zhu Lingya, He Huaying, Hu Yong. Non-Uniformity Correction Method Based on Standard Deviation Value Compensation after Moment Matching[J]. Acta Optica Sinica, 2013, 33(12): 1211002 Copy Citation Text show less
    Cited By
    Article index updated: May. 18, 2024
    Citation counts are provided from Researching.
    The article is cited by 1 article(s) from Researching.
    Abstract
    Get PDF(in Chinese)
    Figures&Tables (0)
    Equations (0)
    References (15)
    Cited By (1)
    Get Citation
    Copy Citation Text
    Zhu Shanyou, Zhang Guixin, Gong Cailan, Zhu Lingya, He Huaying, Hu Yong. Non-Uniformity Correction Method Based on Standard Deviation Value Compensation after Moment Matching[J]. Acta Optica Sinica, 2013, 33(12): 1211002
    Download Citation
    Set citation alerts for the article
    Tools
    Share
    Set citation alerts for the article
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology