• Acta Optica Sinica
  • Vol. 35, Issue 6, 612005 (2015)
Wen Changli1、2、*, Xu Rong1、2, Men Tao1、2, and Liu Changhai1、2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/aos201535.0612005 Cite this Article Set citation alerts
    Wen Changli, Xu Rong, Men Tao, Liu Changhai. Rotation Elimination and Evaluation of Length of Measuring Images without Damage of Polysiloxane Waveguide[J]. Acta Optica Sinica, 2015, 35(6): 612005 Copy Citation Text show less

    Abstract

    Recently, optical interconnection technology has become a hot research topic due to the inherent proldems of electronic interconnection technology. Organic optical waveguide plays a most important role in optical interconnection because of its own advantages. Polysiloxane optical waveguide is one of the best waveguide of 850 nm. One of the most difficult problems in research is how to realize the high precision measurement without damage for the loss of waveguide. Measurement of CCD without damage becomes the focus of research because of its simple application. This paper is based on the problems in measurement of CCD about how to ensure the transmission direction of light in measuring image to keep a high level of precision and how to evaluate the length of optical channel. Eliminating rotation theory and method of waste measuring image without damage of polysiloxane optical waveguide are proposed. The theory and method of evaluating length of optical channel are proposed, either. At last, the results are compared with the traditional cutting off method. The correctness and effective ness of the proposed method are verified.
    Wen Changli, Xu Rong, Men Tao, Liu Changhai. Rotation Elimination and Evaluation of Length of Measuring Images without Damage of Polysiloxane Waveguide[J]. Acta Optica Sinica, 2015, 35(6): 612005
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