Author Affiliations
1Science and Technology on Electro-Optic Control Laboratory, Luoyang, Henan 471000, China2Luoyang Institute of Electro-Optical Equipment, AVIC, Luoyang, Henan 471000, Chinashow less
Fig. 1. Structure of coaxial tri-reflection optical system
Fig. 2. Optical system structure
Fig. 3. Optical structural diagram of non-central obscure design
Fig. 4. Optical system without considering central obscuration. (a) Initial structural diagram; (b) modulation transfer function
Fig. 5. Optical structure and image quality evaluation function diagram of small off-axis optical system based on the first type of method. (a) Optical system structure diagram; (b) modulation transfer function; (c) root mean square spot
Fig. 6. Optical system without considering Seidel aberration. (a) Initial structural diagram; (b) modulation transfer function
Fig. 7. Optical structure and image quality evaluation function diagram of small off-axis optical system based on the second type of method. (a) Optical system structure diagram; (b) modulation transfer function; (c) root mean square spot
Fig. 8. Compact optical system structure and image quality evaluation function diagram based on the first type of method. (a) Optical system structure diagram; (b) modulation transfer function; (c) root mean square spot
Fig. 9. Optical system without considering Seidel aberration. (a) Initial structural diagram; (b) modulation transfer function
Fig. 10. Compact optical system structure and image quality evaluation function diagram based on the second type of method. (a) Optical system structure diagram; (b) modulation transfer function; (c) root mean square spot
Systemstructure | α1 | α2 | β1 | β2 |
---|
-、+、- | (0,1) | (0,1) | (-¥,-1) | (-1,0) | -、+、- | (0,1) | (1,+¥) | (0,+¥) | (0,+¥) | +、-、- | (1,+¥) | (1,+¥) | (-¥,-1) | (0,+¥) | +、-、- | (1,+¥) | (0,1) | (0,+¥) | (-1,0) |
|
Table 1. Effects of contour parameters without intermediate imaging on optical system
Systemstructure | α1 | α2 | β1 | β2 |
---|
-、+、- | (-¥,0) | (1,+¥) | (-1,0) | (0,+¥) | -、+、- | (0,1) | (-¥,0) | (-¥,-1) | (0,+¥) | +、-、- | (1,+¥) | (-¥,-1) | (0,+¥) | (0,+¥) |
|
Table 2. Effects of contour parameters with intermediate imaging on optical system
Surface | Surface type | Radius /mm | Thickness /mm |
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1 | Zernike | -402.38 | -100.48 | 2 | Zernike | -160.94 | -100.48 | 3 | Conic | -191.77 | -132.10 |
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Table 3. Structure parameters of small off-axis optical system based on the first type of method
Surface | Surface type | Radius /mm | Thickness /mm |
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1 | Zernike | -474.48 | -150.18 | 2 | Zernike | -212.10 | -150.18 | 3 | Conic | -285.56 | -172.69 |
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Table 4. Structure parameters of small off-axis optical system based on the second type of method
Surface | Surface type | Radius /mm | Thickness /mm |
---|
1 | Zernike | -3902.92 | -181.04 | 2 | Conic | 863.70 | 122.77 | 3 | Zernike | -575.58 | -135.04 |
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Table 5. Compact optical system structure parameters based on the first type of method
Surface | Surface type | Radius /mm | Thickness /mm |
---|
1 | Zernike | -2045.95 | -132.27 | 2 | Conic | 1640.29 | -132.27 | 3 | Zernike | -693.11 | -204.65 |
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Table 6. Compact optical system structure parameters based on the second type of method
Parameter | Small off-axisangle | Compact opticalsystem |
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Class I | Class II | Class I | Class II |
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MaximumRMS /μm | 6.505 | 6.200 | 14.838 | 13.032 | 20 lp/mm MTF | >0.85 | >0.86 | >0.78 | >0.81 |
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Table 7. Optical system image quality evaluation function