Research of performance test system of avalanche diode

Hang YIN; Zhanyong HONG; Chuanyang DING

doi:10.3969/j.issn.1007-5461. 20.010

Journals >Chinese Journal of Quantum Electronics >Volume 37 >Issue 3 >Page 321 > Article

Chinese Journal of Quantum Electronics
Vol. 37, Issue 3, 321 (2020)

Research of performance test system of avalanche diode

Hang YIN^1、2、*, Zhanyong HONG^1、2, and Chuanyang DING³

Author Affiliations

¹[in Chinese]

²[in Chinese]

³[in Chinese]

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DOI: 10.3969/j.issn.1007-5461. 20.010 Cite this Article

YIN Hang, HONG Zhanyong, DING Chuanyang. Research of performance test system of avalanche diode[J]. Chinese Journal of Quantum Electronics, 2020, 37(3): 321 Copy Citation Text

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References

CLP Journals

[1] ZHENG Lijun, LIU Chunjuan, WANG Zaixing, SUN Xiaxia, LIU Xiaozhong. Investigation of forward double barrier characteristics of 6H-SiC based MPS diodes[J]. Chinese Journal of Quantum Electronics, 2021, 38(1): 99

YIN Hang, HONG Zhanyong, DING Chuanyang. Research of performance test system of avalanche diode[J]. Chinese Journal of Quantum Electronics, 2020, 37(3): 321

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