• Infrared and Laser Engineering
  • Vol. 34, Issue 1, 58 (2005)
[in Chinese]*, [in Chinese], and [in Chinese]
Author Affiliations
  • [in Chinese]
  • show less
    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. Experimental study of wavefront sensors for increasing signal-to-noise ratios[J]. Infrared and Laser Engineering, 2005, 34(1): 58 Copy Citation Text show less
    References

    [1] H von Helmholtz.Physiological Optics [M] .New York: Dover, 1896.

    [2] Liang J,Grimm B,Goelz S,et al. Objective measurement of the wave aberrations of the human eye with the use of a Hartmann-Sack Shack wave-front sensor[J].J Opt Soc Am A, 1994,11:1949-1957.

    [3] Hofer H,Artal P,Singer B,et al.Dynamics of the eye's wave aberration [J].J Opt Soc Am A,2000,18:497-506.

    [4] Liang J, Williams D R. Aberrations and retinal image quality of the normal human eye[J].J Opt Soc Am A,1997,14:2873-2883.

    [6] Pierscionek B K,Weale R A.Investigation of the polarization optics of the living human cornea and lens with Purkinje images[J].Applied Optics,1998,37: 6845-6851.

    [7] Williams D R,Brainard D H,Mcmahon M J,et al.Double-pass and interferometric measures of the optical quality of the eye[J].J Opt Soc Am A, 1994,11:3123-3135.

    [8] Van Blokland G J.Ellipsometry of the human retina in vivo:preeservation of polarization[J].J Opt Soc Am A,1985, 2:72-75.

    [9] Bueno J M,Artal P. Double-pass imaging polarimetry in thehumen eye [J].Optic Letters,1999,24: 64-66.

    CLP Journals

    [1] Hongnan Zhao, Wensong Jiang, Li Yang, Zai Luo, Hongyang Li. Correction method for edge deviation of line laser sensor[J]. Infrared and Laser Engineering, 2022, 51(4): 20210317

    [2] Xu Ancheng, Chen Jiabi, Zhang Peiming. Error Analysis of Ocular Aberration Measurement Instrument Based on Hartmann-Shack Wavefront Sensor[J]. Laser & Optoelectronics Progress, 2010, 47(8): 82801

    [in Chinese], [in Chinese], [in Chinese]. Experimental study of wavefront sensors for increasing signal-to-noise ratios[J]. Infrared and Laser Engineering, 2005, 34(1): 58
    Download Citation