[1] J. C. Mullikin, L. J. van Vliet, H. Netten et al.. Methods for CCD camera characterization[C]. SPIE, 1994, 2173: 73~84
[2] Ralf Widenhorn, Lars Mundermann, Armin Rest et al.. Meyer-Neldel rule for dark current in charge-coupled device[J]. J. Appl. Phys., 2001, 89(2): 8179~8182
[3] Ralf Widenhorn, Ines Hartwig, Justin C. Dunlap et al.. Measurement of dark current in a CCD imager during light exposure[C]. SPIE, 2008, 6816: 68160B
[4] Richard L. Baer. A model for dark current characterization and simulation[C]. SPIE, 2006, 6068: 606805
[5] Ren Huanhuan, Yuan Ping, He Jianwei et al.. Study of the radiation calibration of TDI-CCD spatial stereo camera[J]. Acta Optica Sinica, 2008, 28(1): 99~104
[8] J. R. Janesick. Scientific Charge-Coupled Devices [M]. Bellingham: SPIE Press, 2001.105~106
[10] Zhang Huige, Wang Zhebin, Zhang Wenhai. Linearity slope and nonlinear scale for CCD sampling and collecting system[J]. High Power Laser and Particle Beams, 2008, 20(8): 1313~1316