• Opto-Electronic Engineering
  • Vol. 32, Issue 6, 20 (2005)
[in Chinese]1、2, [in Chinese]3, [in Chinese]1, [in Chinese]2, and [in Chinese]2
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. [J]. Opto-Electronic Engineering, 2005, 32(6): 20 Copy Citation Text show less
    References

    [1] EUGENE SCOTT Baker, RONALD D DeGroat. A correlation-based subspace tracking algorithm[J]. IEEE Trans on Signal Proceesing,1998,46(11):3112-3116.

    [3] DANIEL P Huttenlocher, GREGORY A Klanderman, WILLIAM J Rucklidge. Comparing images using the Hausdorff distance [J]. IEEE Trans on PAMI,1993,15(9):850-863.

    [5] VIRGINIA C Klema, ALAN J Laub. The singular value decomposition: Its computation and some applications [J]. IEEE Trans on Automatic Control,1980,25(2):164-176.

    [7] B K Artikeyan, A Sarkar. Shape description by time Series [J]. IEEE Trans on PAMI,1989,11(9):977-984.

    CLP Journals

    [1] WANG Li-hua, WU Shi-bin, HOU Xi, KUANG Long, CAO Xue-dong. Measurement of Flat Wavefront by Sub-aperture Stitching Interferometry[J]. Opto-Electronic Engineering, 2009, 36(6): 126

    [2] Zhang Lei, Tian Chao, Liu Dong, Shi Tu, Yang Yongying, Shen Yibing. Non-Null Annular Subaperture Stitching Interferometry for Aspheric Test[J]. Acta Optica Sinica, 2014, 34(8): 812003

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. [J]. Opto-Electronic Engineering, 2005, 32(6): 20
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