Author Affiliations
College of Electronic Engineering, South China Agricultural University, Guangzhou, Guangdong 510642, Chinashow less
Fig. 1. Direct detection of surface scattering light
Fig. 2. Measurement coordinate system
Fig. 3. Schematic diagram of system
Fig. 4. Illuminance-signal curve under uniform illumination
Fig. 5. Spatial distribution of radiation flux measured when the measured plane is evenly divided with different spatial resolutions under uniform illumination (left) and its theoretical calculation results (right). (a) 8×8; (b) 16×16; (c) 32×32
Fig. 6. Actual illuminance distribution and theoretical illuminance distribution to achieve uniform radiation flux distribution(resolution: 8×8). (a) Actual illuminance distribution; (b) theoretical illuminance distribution
Fig. 7. Detection of total radiant flux of ceramic tile (illuminance design distribution on sample)
Fig. 8. Seven samples. (a) Sample a; (b) sample b; (c) sample c; (d) sample d; (e) sample e; (f) sample f; (g) sample g
Fig. 9. Two cracked samples. (a) Sample 1; (b) sample 2
Fig. 10. Scratch sample
Type of ceramic tile | Total radiation flux for seven samples | Standard deviation |
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#1 | #2 | #3 | #4 | #5 | #6 | #7 | #8 |
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a | 2.32330 | 2.35508 | 2.32056 | 2.35134 | 2.31523 | 2.32954 | 2.30082 | 2.32227 | 0.01808 | b | 2.01055 | 2.02178 | 2.01476 | 2.01109 | 2.01677 | 2.03002 | 2.04237 | 2.02506 | 0.01080 | c | 2.01683 | 2.01332 | 2.01062 | 2.02268 | 2.01200 | 2.00849 | 2.01609 | 2.04563 | 0.01191 | d | 1.94863 | 1.92889 | 1.96962 | 1.96664 | 1.97025 | 1.97392 | 1.97292 | 1.97676 | 0.01641 | e | 2.07891 | 2.05232 | 2.04613 | 2.05681 | 2.11497 | 2.07559 | 2.08232 | 2.12180 | 0.02786 | f | 1.86095 | 1.86811 | 1.87432 | 1.86579 | 1.90591 | 1.91889 | 1.93557 | 1.92143 | 0.02973 | g | 1.65188 | 1.65991 | 1.66125 | 1.67660 | 1.65373 | 1.64322 | 1.63327 | 1.64359 | 0.01335 |
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Table 1. Statistics of total radiation fluxes of seven ceramic tile samplesunit: V
Crack type | Signal | Total radiation flux of cracked samples with different orientations | Total radiation flux of uncracked samples |
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1→2 | 2→3 | 3→4 | 4→1 |
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1 | S | 2.23165 | 2.22667 | 2.21948 | 2.19788 | 2.31696 | || | 0.08531 | 0.09029 | 0.09748 | 0.11908 | | 2 | S | 2.18868 | 2.19548 | 2.22779 | 2.21027 | 2.31696 | || | 0.12828 | 0.12148 | 0.08917 | 0.10669 | |
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Table 2. Total radiation fluxes of uncracked and cracked samples unit: V
Type of ceramic tile | Signal | Total radiation flux of scratched samples with different depths | Total radiation flux of unscratched samples |
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L=5 | L=10 | L=15 |
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a | S | 2.00277 | 1.99003 | 1.97957 | 2.01705 | || | 0.01428 | 0.02702 | 0.03748 | | d | S | 2.06193 | 2.04058 | 2.02247 | 2.08423 | || | 0.0223 | 0.04365 | 0.06176 | | e | S | 2.06235 | 2.04852 | 2.03255 | 2.07279 | || | 0.01044 | 0.02427 | 0.04024 | | f | S | 1.66174 | 1.65206 | 1.64455 | 1.67433 | || | 0.01259 | 0.02227 | 0.02978 | |
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Table 3. Total radiation fluxes of scratched samples with different depths and unscratched samples unit: V