• Laser & Optoelectronics Progress
  • Vol. 58, Issue 12, 1212003 (2021)
Haoyi Ouyang, Wanjun Chen, Hai Li**, and Chuping Yang*
Author Affiliations
  • College of Electronic Engineering, South China Agricultural University, Guangzhou, Guangdong 510642, China
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    DOI: 10.3788/LOP202158.1212003 Cite this Article Set citation alerts
    Haoyi Ouyang, Wanjun Chen, Hai Li, Chuping Yang. Single Pixel Detection Theory of Flat Surface Reflectivity Anomaly[J]. Laser & Optoelectronics Progress, 2021, 58(12): 1212003 Copy Citation Text show less
    Direct detection of surface scattering light
    Fig. 1. Direct detection of surface scattering light
    Measurement coordinate system
    Fig. 2. Measurement coordinate system
    Schematic diagram of system
    Fig. 3. Schematic diagram of system
    Illuminance-signal curve under uniform illumination
    Fig. 4. Illuminance-signal curve under uniform illumination
    Spatial distribution of radiation flux measured when the measured plane is evenly divided with different spatial resolutions under uniform illumination (left) and its theoretical calculation results (right). (a) 8×8; (b) 16×16; (c) 32×32
    Fig. 5. Spatial distribution of radiation flux measured when the measured plane is evenly divided with different spatial resolutions under uniform illumination (left) and its theoretical calculation results (right). (a) 8×8; (b) 16×16; (c) 32×32
    Actual illuminance distribution and theoretical illuminance distribution to achieve uniform radiation flux distribution(resolution: 8×8). (a) Actual illuminance distribution; (b) theoretical illuminance distribution
    Fig. 6. Actual illuminance distribution and theoretical illuminance distribution to achieve uniform radiation flux distribution(resolution: 8×8). (a) Actual illuminance distribution; (b) theoretical illuminance distribution
    Detection of total radiant flux of ceramic tile (illuminance design distribution on sample)
    Fig. 7. Detection of total radiant flux of ceramic tile (illuminance design distribution on sample)
    Seven samples. (a) Sample a; (b) sample b; (c) sample c; (d) sample d; (e) sample e; (f) sample f; (g) sample g
    Fig. 8. Seven samples. (a) Sample a; (b) sample b; (c) sample c; (d) sample d; (e) sample e; (f) sample f; (g) sample g
    Two cracked samples. (a) Sample 1; (b) sample 2
    Fig. 9. Two cracked samples. (a) Sample 1; (b) sample 2
    Scratch sample
    Fig. 10. Scratch sample
    Type of ceramic tileTotal radiation flux for seven samplesStandard deviation
    #1#2#3#4#5#6#7#8
    a2.323302.355082.320562.351342.315232.329542.300822.322270.01808
    b2.010552.021782.014762.011092.016772.030022.042372.025060.01080
    c2.016832.013322.010622.022682.012002.008492.016092.045630.01191
    d1.948631.928891.969621.966641.970251.973921.972921.976760.01641
    e2.078912.052322.046132.056812.114972.075592.082322.121800.02786
    f1.860951.868111.874321.865791.905911.918891.935571.921430.02973
    g1.651881.659911.661251.676601.653731.643221.633271.643590.01335
    Table 1. Statistics of total radiation fluxes of seven ceramic tile samplesunit: V
    Crack typeSignalTotal radiation flux of cracked samples with different orientationsTotal radiation flux of uncracked samples
    1→22→33→44→1
    1S2.231652.226672.219482.197882.31696
    |Δ1|0.085310.090290.097480.11908
    2S2.188682.195482.227792.210272.31696
    |Δ1|0.128280.121480.089170.10669
    Table 2. Total radiation fluxes of uncracked and cracked samples unit: V
    Type of ceramic tileSignalTotal radiation flux of scratched samples with different depthsTotal radiation flux of unscratched samples
    L=5L=10L=15
    aS2.002771.990031.979572.01705
    |Δ2|0.014280.027020.03748
    dS2.061932.040582.022472.08423
    |Δ2|0.02230.043650.06176
    eS2.062352.048522.032552.07279
    |Δ2|0.010440.024270.04024
    fS1.661741.652061.644551.67433
    |Δ2|0.012590.022270.02978
    Table 3. Total radiation fluxes of scratched samples with different depths and unscratched samples unit: V
    Haoyi Ouyang, Wanjun Chen, Hai Li, Chuping Yang. Single Pixel Detection Theory of Flat Surface Reflectivity Anomaly[J]. Laser & Optoelectronics Progress, 2021, 58(12): 1212003
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