• Opto-Electronic Engineering
  • Vol. 34, Issue 9, 21 (2007)
[in Chinese]1、2, [in Chinese]1, [in Chinese]1、2, and [in Chinese]1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Stray light reduction analysis in single star simulator[J]. Opto-Electronic Engineering, 2007, 34(9): 21 Copy Citation Text show less
    References

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    [9] Meister G,Wiemker R,Bienlein J,et al.In situ BRDF messurements of selected surface materials to improve analysis of remotely sensed multispectral imagery[A].Proc of the 18 th Congress of the Int.Soc.for Photogrammetry and Remote Sensing[C].Vienna:ISPRS,1996,XXXI(BT):493-498.

    [10] Dana K J.BRDF/BTDF measurement device[J].ICCV,2001,2:460-466.

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    [12] J Voss Kenneth,Chapin Albert,Monti Marco.Instrument to measure the bidirectional reflectance distribution function of surfaces[J].APPLIED OPTICS,2000,39(:33):6197-6206.

    [13] LI Song.Principle analysis of Detecting collimating performance of light beam[J].Journal of Genmatics,1999,2:30-31.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Stray light reduction analysis in single star simulator[J]. Opto-Electronic Engineering, 2007, 34(9): 21
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