A novel technology on infrared multi-band low-background detection

Zheng Zhen; Yingrui Wang; Wen Ou; Jun Zhou; Ang Li

doi:10.3788/IRLA20190361

Journals >Infrared and Laser Engineering >Volume 49 >Issue 5 >Page 20190361 > Article

Infrared and Laser Engineering
Vol. 49, Issue 5, 20190361 (2020)

A novel technology on infrared multi-band low-background detection

Zheng Zhen, Yingrui Wang, Wen Ou, Jun Zhou, and Ang Li

Author Affiliations

Beijing Institute of Remote Sensing Equipment, Beijing 100854, China

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DOI: 10.3788/IRLA20190361 Cite this Article

Zheng Zhen, Yingrui Wang, Wen Ou, Jun Zhou, Ang Li. A novel technology on infrared multi-band low-background detection[J]. Infrared and Laser Engineering, 2020, 49(5): 20190361 Copy Citation Text

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$Ordinary temperature optical system of refraction-reflection$

Fig. 1. Ordinary temperature optical system of refraction-reflection

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$Low temperature optical system of refraction-reflection$

Fig. 2. Low temperature optical system of refraction-reflection

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Fig. 3. Detection system based on dual-band FPA

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Fig. 4. Dual-band detection system by optical splitter

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$Dual-band detection system by optical splitter based on ordinary temperature refraction-reflection optical system$

Fig. 5. Dual-band detection system by optical splitter based on ordinary temperature refraction-reflection optical system

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Parameter	Wave band: 7.5-10.5 μm; Optical field of view: 2.5°×2.5°; f/#=2; Optical reflectivity: 99.2%; Lens transmission: 98.5%; Metal absorptivity: 20%; Metal reflectivity: 80%
Type	Ordinary temperature optical system of refraction-reflection	Coaxial four anti optical system	Low temperature optical system of refraction-reflection
Energy of self-radiation/W	2.6×10⁻⁵	1.47×10⁻⁵	6.5×10⁻⁶
Equivalent blackbody temperature/K	223	204	183

Table 1. Self-radiation analysis of optical system

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Stacked dual FPA（183 K）		Two FPA（183 K）
NEQ(ph·cm²·s⁻¹)	D*(cm·Hz^1/2·W⁻¹)	NEQ(ph·cm²·s⁻¹)	D*(cm·Hz^1/2·W⁻¹)
Band 1: 4×10¹¹; Band 2: 6×10¹¹	Band 1: 4.2×10¹¹; Band 2: 3×10¹¹	Band 1: 1.22×10¹¹; Band 2: 2.15×10¹¹	Band 1: 8×10¹¹; Band 2: 5×10¹¹

Table 2. D* analysis

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TYPE	Ordinary temperature refraction-reflection dual-band detection system	Dual-FPA detection system	Low temperature refraction-reflection dual-band detection system
Main parameter	Band 1: 7-8.5 μm; Band 2: 10-11.5 μm; Optical field of view：2.5°×2.5°; f/#=2; Equivalent blackbody temperature: 220 K;	Band 1: 7-8.5 μm; Band 2: 10-11.5 μm; Optical field of view: 2.5°×2.5°; f/#=2; Equivalent blackbody temperatur: 183 K;	Band 1: 7-8.5 μm; Band 2: 10-11.5 μm; Optical field of view: 2.5°×2.5°; f/#=2; Equivalent blackbody temperatur: 183 K;
Theory parameter by calculation	Int: 1.5 ms; Band 1 D: 4×10¹¹ (cm·Hz^1/2·W⁻¹); Band 2 D: 2.5×10¹¹ (cm·Hz^1/2·W⁻¹);	Int: 3 ms; Band 1 D:4.2×10¹¹ (cm·Hz^1/2·W⁻¹); Band 2 D:3×10¹¹ (cm·Hz^1/2·W⁻¹);	Int: 6 ms; Band 1 D: 8×10¹¹ (cm·Hz^1/2·W⁻¹); Band 2 D: 5×10¹¹ (cm·Hz^1/2·W⁻¹);
NEFD（W/cm²）	Band 1: 0.6×10⁻¹⁴; Band 2: 0.85×10⁻¹⁴	Band 1: 0.34×10⁻¹⁴; Band 2: 0.6×10⁻¹⁴	Band 1: 0.13×10⁻¹⁴; Band 2: 0.26×10⁻¹⁴

Table 3. Ability analysis of three different dual-band detection systems

Zheng Zhen, Yingrui Wang, Wen Ou, Jun Zhou, Ang Li. A novel technology on infrared multi-band low-background detection[J]. Infrared and Laser Engineering, 2020, 49(5): 20190361

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