Grating diffraction interferometry for measuring film refractive index

[in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 31 >Issue 6 >Page 34 > Article

Opto-Electronic Engineering
Vol. 31, Issue 6, 34 (2004)

Grating diffraction interferometry for measuring film refractive index

[in Chinese], [in Chinese], and [in Chinese]

Author Affiliations

[in Chinese]

show less

DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese]. Grating diffraction interferometry for measuring film refractive index[J]. Opto-Electronic Engineering, 2004, 31(6): 34 Copy Citation Text

show less

References

[1] AZZAM R M A , BASHARA N M. Ellipsometry and polarized light[M]. New York: North-Holland Publishing Company, 1977.269-416.

[in Chinese], [in Chinese], [in Chinese]. Grating diffraction interferometry for measuring film refractive index[J]. Opto-Electronic Engineering, 2004, 31(6): 34

Download Citation

Tools

Save the article for my favorites

Paper Information