• Acta Optica Sinica
  • Vol. 43, Issue 11, 1112002 (2023)
Zongtao Duan1, Jian Zhang1、2、3、*, Guoyu Zhang1、2、3, Yangyang Zou4, Zhengjie Niu1, Bin Zhao1, Xiaoxu Mo1, Zhikun Yun1, Jianliang Zhang5, and Jia Guo6
Author Affiliations
  • 1School of Opto-Electronic Engineering, Changchun University of Science and Technology, Changchun 130022, Jilin, China
  • 2Jilin Photoelectric Measurement and Control Instrument Engineering Technology Research Center, Changchun 130022, Jilin, China
  • 3Key Laboratory of Optoelectronic Measurement and Control and Optical Information Transmission Technology, Ministry of Education, Changchun 130022, Jilin, China
  • 4College of Instrumentation & Electrical Engineering, Jilin University, Changchun 130012, Jilin, China
  • 5Air Force Aviation University, Changchun 130022, Jilin, China
  • 6Changchun Wanyi Technology Application Co., Ltd., Changchun 130022, Jilin, China
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    DOI: 10.3788/AOS222179 Cite this Article Set citation alerts
    Zongtao Duan, Jian Zhang, Guoyu Zhang, Yangyang Zou, Zhengjie Niu, Bin Zhao, Xiaoxu Mo, Zhikun Yun, Jianliang Zhang, Jia Guo. Measurement of Reflected Light Field of Rough Surfaces Using Ultrawide-angle Imaging[J]. Acta Optica Sinica, 2023, 43(11): 1112002 Copy Citation Text show less
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    Zongtao Duan, Jian Zhang, Guoyu Zhang, Yangyang Zou, Zhengjie Niu, Bin Zhao, Xiaoxu Mo, Zhikun Yun, Jianliang Zhang, Jia Guo. Measurement of Reflected Light Field of Rough Surfaces Using Ultrawide-angle Imaging[J]. Acta Optica Sinica, 2023, 43(11): 1112002
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