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    Journals >Spectroscopy and Spectral Analysis >Volume 44 >Issue 5 >Page 1297 > Article
    • Spectroscopy and Spectral Analysis
    • Vol. 44, Issue 5, 1297 (2024)
    Analysis and Calculation of Escape Peaks in Silicon Drift Detectors
    LIAO Xue-liang*, LIU Ming-bo, CHENG Da-wei, and SHEN Xue-jing
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    DOI: 10.3964/j.issn.1000-0593(2024)05-1297-04 Cite this Article
    LIAO Xue-liang, LIU Ming-bo, CHENG Da-wei, SHEN Xue-jing. Analysis and Calculation of Escape Peaks in Silicon Drift Detectors[J]. Spectroscopy and Spectral Analysis, 2024, 44(5): 1297 Copy Citation Text show less
    References

    [4] Reed S J B, Ware N G. Journal of Physics E：Scientific Instruments, 1972, 5(6): 582.

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    LIAO Xue-liang, LIU Ming-bo, CHENG Da-wei, SHEN Xue-jing. Analysis and Calculation of Escape Peaks in Silicon Drift Detectors[J]. Spectroscopy and Spectral Analysis, 2024, 44(5): 1297
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