• Acta Optica Sinica
  • Vol. 37, Issue 12, 1214002 (2017)
Tianyu Chen, Mingdi Wang*, Guilin Yang, Kai Liu, and Keming Shi
Author Affiliations
  • School of Mechanical and Electric Engineering, Soochow University, Suzhou, Jiangsu 215021, China
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    DOI: 10.3788/AOS201737.1214002 Cite this Article Set citation alerts
    Tianyu Chen, Mingdi Wang, Guilin Yang, Kai Liu, Keming Shi. Removal of Cable Shield Material by YAG Laser[J]. Acta Optica Sinica, 2017, 37(12): 1214002 Copy Citation Text show less
    Model of laser peeling of metallic materials
    Fig. 1. Model of laser peeling of metallic materials
    Cloud pictures of temperature field in shielding layer. (a) Temperature field in quasi-steady state; (b) longitudinal distribution of temperature field
    Fig. 2. Cloud pictures of temperature field in shielding layer. (a) Temperature field in quasi-steady state; (b) longitudinal distribution of temperature field
    Influence of laser power on peeling quality of shielding layer
    Fig. 3. Influence of laser power on peeling quality of shielding layer
    Influence of laser scanning speed on peeling quality of shielding layer
    Fig. 4. Influence of laser scanning speed on peeling quality of shielding layer
    Influence of laser frequency on peeling quality of shielding layer
    Fig. 5. Influence of laser frequency on peeling quality of shielding layer
    Influence of defocusing distance on peeling quality of shielding layer
    Fig. 6. Influence of defocusing distance on peeling quality of shielding layer
    (a) Effect picture and (b) kerf surface of laser peeling of shielding layers after laser parameter optimization
    Fig. 7. (a) Effect picture and (b) kerf surface of laser peeling of shielding layers after laser parameter optimization
    Serial numberPower /WScanning speed /(mm·s-1)Frequency /kHzDefocusing distance /mmKerf width /(10-2 mm)Kerf depth /mm
    11253000.2070.019
    21453000.3610.079
    31653000.4820.120
    41853000.5160.120
    52053000.8260.120
    61613000.8610.120
    71633000.7230.120
    81673000.4310.090
    91693000.2580.062
    101651000.3270.099
    111652000.4480.120
    121654000.5610.120
    131655000.5340.109
    1416530-20.1720.040
    1516530-10.3340.087
    161653010.4290.051
    171653020.0860.006
    Table 1. Process parameters and test results for laser peeling of shielding layers
    LevelFactor
    A /WB /(mm·s-1)C /kHzD /mm
    115420-0.5
    2175300
    3196400.5
    Table 2. Factor level table
    Serial numberElementResult
    A /WB /(mm·s-1)C /kHzD /mmKerf width /(10-2 mm)Kerf depth /mm
    115420-0.50.6860.096
    21553000.5490.120
    3156400.50.4810.104
    4174300.50.6580.112
    517540-0.50.5620.120
    61762000.4390.120
    71944000.7130.120
    8195200.50.6990.120
    919630-0.50.6720.120
    Table 3. Arrangement of orthogonal test elements and results
    FactorKerf widthR /(10-2 mm)
    k1 /(10-2 mm)k2 /(10-2 mm)k3 /(10-2 mm)
    A0.5720.5530.6950.142
    B0.6860.6030.5310.155
    C0.6080.6260.5850.041
    D0.6400.5670.6130.073
    Table 4. Range analysis results of kerf widths
    FactorKerf depthR /mm
    s1 /mms2 /mms3 /mm
    A0.1070.1170.1200.013
    B0.1090.1200.1150.011
    C0.1120.1170.1150.005
    D0.1120.1200.1120.008
    Table 5. Range analysis results of kerf depths
    Tianyu Chen, Mingdi Wang, Guilin Yang, Kai Liu, Keming Shi. Removal of Cable Shield Material by YAG Laser[J]. Acta Optica Sinica, 2017, 37(12): 1214002
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