• Laser & Optoelectronics Progress
  • Vol. 56, Issue 8, 083002 (2019)
Youming Shi1、*, Dongyu Li1, Shilai Yi2, and Cuiqiong Yan1
Author Affiliations
  • 1 College of Physics and Electronic Engineering, Qujing Normal University, Qujing, Yunnan 655011, China
  • 2 Citrus Research Institute, Chinese Academy of Agricultural Sciences-Southwest University, Chongqing 400712, China
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    DOI: 10.3788/LOP56.083002 Cite this Article Set citation alerts
    Youming Shi, Dongyu Li, Shilai Yi, Cuiqiong Yan. Infrared Spectroscopy Analysis of Biochemical Changes of Corn Leaves Infected by Southern Corn Leaf Blight Disease[J]. Laser & Optoelectronics Progress, 2019, 56(8): 083002 Copy Citation Text show less

    Abstract

    The infrared spectroscopy method is employed to analyze the corn leaves infected by the southern corn leaf blight disease and the molecular structure information of infected corn leaves is obtained. The research results show that the fungal pathogens have certain effects on the protein structure of the leaves. The two-dimensional correlation infrared spectral analysis indicates that the β-sheet conformation of the protein secondary structure in healthy corn leaves changes with the growth and metabolism of corn leaves, while in the infected corn leaves is the change of the β-turn conformation. Two-dimensional correlation infrared spectroscopy can be used to reveal the change of molecular structures of corn leaves invaded by the fungal pathogens and provide a reference for the prevention and control of corn diseases.
    Youming Shi, Dongyu Li, Shilai Yi, Cuiqiong Yan. Infrared Spectroscopy Analysis of Biochemical Changes of Corn Leaves Infected by Southern Corn Leaf Blight Disease[J]. Laser & Optoelectronics Progress, 2019, 56(8): 083002
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