• Acta Physica Sinica
  • Vol. 69, Issue 1, 018501-1 (2020)
Yin-Hong Luo1、*, Feng-Qi Zhang1, Hong-Xia Guo1, and Hajdas Wojtek2
Author Affiliations
  • 1State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi’an 710024, China
  • 2Paul Scherrer Institute, Villigen PSI 5232, Switzerland
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    DOI: 10.7498/aps.69.20190878 Cite this Article
    Yin-Hong Luo, Feng-Qi Zhang, Hong-Xia Guo, Hajdas Wojtek. Prediction of proton single event upset sensitivity based on heavy ion test data in nanometer hardened static random access memory[J]. Acta Physica Sinica, 2020, 69(1): 018501-1 Copy Citation Text show less
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    Yin-Hong Luo, Feng-Qi Zhang, Hong-Xia Guo, Hajdas Wojtek. Prediction of proton single event upset sensitivity based on heavy ion test data in nanometer hardened static random access memory[J]. Acta Physica Sinica, 2020, 69(1): 018501-1
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