• Acta Physica Sinica
  • Vol. 69, Issue 1, 018501-1 (2020)
Yin-Hong Luo1、*, Feng-Qi Zhang1, Hong-Xia Guo1, and Hajdas Wojtek2
Author Affiliations
  • 1State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi’an 710024, China
  • 2Paul Scherrer Institute, Villigen PSI 5232, Switzerland
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    DOI: 10.7498/aps.69.20190878 Cite this Article
    Yin-Hong Luo, Feng-Qi Zhang, Hong-Xia Guo, Hajdas Wojtek. Prediction of proton single event upset sensitivity based on heavy ion test data in nanometer hardened static random access memory[J]. Acta Physica Sinica, 2020, 69(1): 018501-1 Copy Citation Text show less

    Abstract

    In order to evaluate the radiation tolerance to proton single event effect(SEE) in nanometer dual interlocked cell (DICE) hardening device accurately, single event upset (SEU) linear energy transfer (LET) threshold at heavy ion normal and tilt incidence, and the worst case SEU orientational angle are acquired based on the analysis of heavy ion SEU testing data in 65 nm dual DICE static random access memory (SRAM). It is proved that dual DICE design is effective for improving the LET threshold against SEU. Howerer, heavy ion tilt incidence at the worst orientational angle will significantly reduce the SEU threshold and increase the SEU cross section. The worst orientational angle for SEU in DICE SRAM is the large tilting angle along the well. The maximum LET value and the emission angle distribution of secondary particle induced by the nuclear reaction between protons with different energy and layers with different multiple metallization are obtained by using Monte-Carlo simulation. The maximum LET value of secondary particle from proton-copper spallation reaction is higher than 15 MeV·cm2/mg for 100 MeV and 200 MeV protons. Secondary particles with the maximum energy and longest range are emitted preferentially in the forward direction. Proton SEU sensitivity is further predicted through combining heavy ion test data with Monte-Carlo simulation. Proton SEU test data verify the effectiveness of the prediction method and the accuracy of the prediction results. The research results indicate that the tolerance of nanometer DICE hardening technique against proton SEU will be overestimated if SEE evaluation test is carried out with only 100 MeV proton accelerator or normal incidence. Proton single event upset in nanometer dual DICE SRAM has an evident dependence on tilt angle and orientational angle. By adopting the above prediction method, whether proton SEE test needs performing or not in nanometer radiation-hardening device can be judged and screened. The requirements for the maximum energy of proton accelerator can be ascertained. In order to ensure that the devices are applied to space with high reliability, SEE test should be carried out including tilt incidence at the worst orientational angle in nanometer DICE hardening device in the process of heavy ion and proton SEE test evaluation.
    Yin-Hong Luo, Feng-Qi Zhang, Hong-Xia Guo, Hajdas Wojtek. Prediction of proton single event upset sensitivity based on heavy ion test data in nanometer hardened static random access memory[J]. Acta Physica Sinica, 2020, 69(1): 018501-1
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