Yin-Hong Luo, Feng-Qi Zhang, Hong-Xia Guo, Hajdas Wojtek. Prediction of proton single event upset sensitivity based on heavy ion test data in nanometer hardened static random access memory [J]. Acta Physica Sinica, 2020, 69(1): 018501-1

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- Acta Physica Sinica
- Vol. 69, Issue 1, 018501-1 (2020)
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