A approach that liquid crystal variable retrader (LCVR) is used as a compensator to test the 2-D distribution of optical path diffevence (OPD) of liquid crystal device under the condition of white light irradiation of polarizing microscope is proposed. The system used for testing and verifying 2-D distribution of OPD under the orthogonal polarization is set up. The OPD of LCVR is tested by using the system. The results tested by using this system and the Senamont are calibrated, the error is within 3%. On that basis, the 2-D distribution of OPD of liquid crystal light deflecter (DLD) and optical addressable-transimission space light modulater (OA-TSLM) are measured by using that system, and their regularities of distribution can also be obtained. It can be used to test the liquid crystal-optical phased array (LC-OPA), when the method is further optimized. Research significance lies in many aspects, such as, the 2-D distribution of OPD′ microstructure, which the electronic liquid crystal devicesare in multiple wavelengths and include near-infrared band can be used to test by this way with the system. The flyback,phase valley and nonlinear driving voltage, LC-OPA′ characteristics can be corrected and detected. It can also be used for optical addressable-space light modulator (OA-SLM) of gamma correction.