• Acta Photonica Sinica
  • Vol. 51, Issue 2, 0251215 (2022)
Xiaobo TAN1, Xin YAN2, Tao YI3, Kai HE2, Zhengzheng SHAO1, Kaikai ZHOU1, Guilong GAO2, Tao WANG2, Jun ZHANG1, and Zhaowen ZHUANG1、*
Author Affiliations
  • 1College of Electronic Science and Technology,National University of Defense Technology,Changsha 410073,China
  • 2Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology,Xi'an Institute of Optics and Precision Mechanics,Chinese Academy of Sciences,Xi'an 710119,China
  • 3Research Center of Laser Fusion,China Academy of Engineering Physics,Mianyang,Sichuan 621900,China
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    DOI: 10.3788/gzxb20225102.0251215 Cite this Article
    Xiaobo TAN, Xin YAN, Tao YI, Kai HE, Zhengzheng SHAO, Kaikai ZHOU, Guilong GAO, Tao WANG, Jun ZHANG, Zhaowen ZHUANG. Experimental Study on the Spatial Performance of Photorefractive X-ray Semiconductor Ultrafast Response Chip[J]. Acta Photonica Sinica, 2022, 51(2): 0251215 Copy Citation Text show less
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    Xiaobo TAN, Xin YAN, Tao YI, Kai HE, Zhengzheng SHAO, Kaikai ZHOU, Guilong GAO, Tao WANG, Jun ZHANG, Zhaowen ZHUANG. Experimental Study on the Spatial Performance of Photorefractive X-ray Semiconductor Ultrafast Response Chip[J]. Acta Photonica Sinica, 2022, 51(2): 0251215
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