The traditional ultrafast electric vacuum devices are usually based on the mechanism of photoelectric conversion, and their performance is restricted by factors such as material response and space-charge effect. It is difficult for the devices like microchannel plate framing cameras, DIlation X-ray Imager (DIXI), streak cameras to achieve high temporal resolution (100 fs~1 ps) and spatial resolution (~μm) two-dimensional imaging. Ultrafast imaging technology based on photorefractive effect is a new ultrafast diagnostic technology, which has the advantages of high spatiotemporal resolution, all-optical, all-solid-state, and anti-radiation. The nonequilibrium carrier lifetime of low-temperature grown AlGaAs (LT-AlGaAs) can reach ps-level. The Ultrafast Response Chip (URC) made of LT-AlGaAs has the characteristics of high temporal resolution, meanwhile, good spatial performance is the other key factor for its application. In this paper, the spatial performance of LT-AlGaAs URC is experimentally studied using X-ray, generated by high-energy nanosecond pulsed laser-produced plasma, as the signal. The results show that the URC has the ability of high spatial resolution and large-scale imaging in the X-ray energy dynamic range of 120∶1. The optimal spatial resolution is ≥ 35 lp/mm @ MTF = 0.1, and the imaging frame can reach 6.7 mm × 6.7 mm. The results further verify the feasibility of ultrafast diagnostic technology based on photorefractive materials. In the future, LT-AlGaAs URC will be combined with ultrafast framing technologies such as dispersion framing and polarization chirp framing to realize multi-frames and high spatiotemporal resolution two-dimensional imaging.