Interferometry fringe processing for torsion measurement

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 32 >Issue 12 >Page 47 > Article

Opto-Electronic Engineering
Vol. 32, Issue 12, 47 (2005)

Interferometry fringe processing for torsion measurement

[in Chinese]^1、2, [in Chinese]¹, [in Chinese]^1、2, and [in Chinese]¹

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¹[in Chinese]

²[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Interferometry fringe processing for torsion measurement[J]. Opto-Electronic Engineering, 2005, 32(12): 47 Copy Citation Text

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References

[5] YOSHIHARU M,MOTOHARU F,SATORU Y.Shape,stress and strain measurement using phase analysis of grating or fringe patterns[J].SPIE,2002,4537:47-52.

[6] NOBUKAZU Y.Fringe pattern correlator for three-dimensional object recognition using multiplex color grating[J].SPIE,2001,4416:436-439.

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Interferometry fringe processing for torsion measurement[J]. Opto-Electronic Engineering, 2005, 32(12): 47

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