• Opto-Electronic Engineering
  • Vol. 32, Issue 12, 47 (2005)
[in Chinese]1、2, [in Chinese]1, [in Chinese]1、2, and [in Chinese]1
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  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Interferometry fringe processing for torsion measurement[J]. Opto-Electronic Engineering, 2005, 32(12): 47 Copy Citation Text show less

    Abstract

    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Interferometry fringe processing for torsion measurement[J]. Opto-Electronic Engineering, 2005, 32(12): 47
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