• Opto-Electronic Engineering
  • Vol. 45, Issue 5, 170725 (2018)
Wang Meizhu1、2、3、*, Huang Xiaoxian1、2、4, and Feng Qi1、2、3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • 4[in Chinese]
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    DOI: 10.12086/oee.2018.170725 Cite this Article
    Wang Meizhu, Huang Xiaoxian, Feng Qi. Elimination method of image rotation for geostationary radiometer and its verification method[J]. Opto-Electronic Engineering, 2018, 45(5): 170725 Copy Citation Text show less
    References

    [1] Zhang E, Gong H X. Research and application of system for offsetting image rotation from 45° rotating scan mirror[J]. Journal of Infrared and Millimeter Waves, 1999, 18(2): 125–132.

    [2] Wang D, Li X Y, Wu Q Z. Design of eliminating image rotation on opto-electronic imaging tracking and measuring device[J]. Opto-Electronic Engineering, 2012, 39(1): 108–112.

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    [7] Wang G Q, Chen G L. Two-dimensional scanning infrared imaging technology on geosynchronous orbit[J]. Infrared and Laser Engineering, 2014, 43(2): 429–433.

    [8] Sun D X, Wang J Y. Scan track of system using 45° mirror and its effect on the correction of image rotation[J]. Journal of Infrared and Millimeter Waves, 2005, 24(1): 19–22.

    [9] Lian T S. Conjugate Theory Of Reflecting Prism[M]. Beijing: Beijing Institute of Technology Press, 1988: 1–3.

    [10] Wang M Z, Huang X X, Feng Q. Two judging methods of seamless stitching for frame sensor on the geostationary orbit: Grid method and the geometric intersection method[J]. Journal of Remote Sensing, 2017, 21(6): 871–880.

    [11] Lowe D G. Distinctive image features from scale-invariant keypoints[ J]. International Journal of Computer Vision, 2004, 60(2): 91–110.

    [12] Fischler M A, Bolles R C. Random sample consensus: A paradigm for model fitting with applications to image analysis and automated cartography[J]. Readings in Computer Vision, 1987, 24(6): 726–740.

    Wang Meizhu, Huang Xiaoxian, Feng Qi. Elimination method of image rotation for geostationary radiometer and its verification method[J]. Opto-Electronic Engineering, 2018, 45(5): 170725
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