Efficiency measurement of optical components in 45–110 nm range at beamline U27, HLS

Shengnan He; Ying Liu; Keqiang Qiu; Hongjun Zhou; Tonglin Huo; Shaojun Fu

doi:10.3788/COL20100812.1131

Journals >Chinese Optics Letters >Volume 8 >Issue 12 >Page 1131 > Article

Chinese Optics Letters
Vol. 8, Issue 12, 1131 (2010)

Efficiency measurement of optical components in 45–110 nm range at beamline U27, HLS

Shengnan He, Ying Liu, Keqiang Qiu, Hongjun Zhou, Tonglin Huo, and Shaojun Fu

Author Affiliations

National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, China

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DOI: 10.3788/COL20100812.1131 Cite this Article Set citation alerts

Shengnan He, Ying Liu, Keqiang Qiu, Hongjun Zhou, Tonglin Huo, Shaojun Fu. Efficiency measurement of optical components in 45–110 nm range at beamline U27, HLS[J]. Chinese Optics Letters, 2010, 8(12): 1131 Copy Citation Text

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