A Flat-Field Spectrograph for Measuring 290～450 nm Spectrum

[in Chinese]; [in Chinese]; [in Chinese]

Journals >Acta Optica Sinica >Volume 24 >Issue 3 >Page 393 > Article

Acta Optica Sinica
Vol. 24, Issue 3, 393 (2004)

A Flat-Field Spectrograph for Measuring 290～450 nm Spectrum

[in Chinese]^*, [in Chinese], and [in Chinese]

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[in Chinese]

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[in Chinese], [in Chinese], [in Chinese]. A Flat-Field Spectrograph for Measuring 290～450 nm Spectrum[J]. Acta Optica Sinica, 2004, 24(3): 393 Copy Citation Text

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References

[3] Peckerar M C, Baker W D,Nagel D J et al.. X-ray sensitivity of a charge-coupled-device array. J. Appl. Phys., 1977, 48(6):2565～2569

[in Chinese], [in Chinese], [in Chinese]. A Flat-Field Spectrograph for Measuring 290～450 nm Spectrum[J]. Acta Optica Sinica, 2004, 24(3): 393

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