• Infrared and Laser Engineering
  • Vol. 35, Issue 2, 249 (2006)
[in Chinese]* and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese]. Test system of parameters of composite IRFPA readout integrated circuit[J]. Infrared and Laser Engineering, 2006, 35(2): 249 Copy Citation Text show less

    Abstract

    [in Chinese], [in Chinese]. Test system of parameters of composite IRFPA readout integrated circuit[J]. Infrared and Laser Engineering, 2006, 35(2): 249
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