Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Acta Optica Sinica >Volume 34 >Issue 3 >Page 312005 > Article
    • Acta Optica Sinica
    • Vol. 34, Issue 3, 312005 (2014)
    Dual-Frequency Quad-Edge Frequency Discrimination Photoelectric Detection Technique Based on Single Fabry-Perot Etalon
    Shen Fahua1、*, Yu Aiai1, Dong Jihui2, Xia Yiqi1, and Liu Chenglin1
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
    • show less
    DOI: 10.3788/aos201434.0312005 Cite this Article Set citation alerts
    Shen Fahua, Yu Aiai, Dong Jihui, Xia Yiqi, Liu Chenglin. Dual-Frequency Quad-Edge Frequency Discrimination Photoelectric Detection Technique Based on Single Fabry-Perot Etalon[J]. Acta Optica Sinica, 2014, 34(3): 312005 Copy Citation Text show less
    Cited By
    Article index updated: May. 20, 2024
    Citation counts are provided from Researching.
    The article is cited by 1 article(s) from Researching.
    Abstract
    Get PDF(in Chinese)
    Figures&Tables (0)
    Equations (0)
    References (22)
    Cited By (1)
    Get Citation
    Copy Citation Text
    Shen Fahua, Yu Aiai, Dong Jihui, Xia Yiqi, Liu Chenglin. Dual-Frequency Quad-Edge Frequency Discrimination Photoelectric Detection Technique Based on Single Fabry-Perot Etalon[J]. Acta Optica Sinica, 2014, 34(3): 312005
    Download Citation
    Set citation alerts for the article
    Tools
    Share
    Set citation alerts for the article
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology