• Journal of Infrared and Millimeter Waves
  • Vol. 22, Issue 1, 31 (2003)
[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. SIZE EFFECT ON OPTICAL EFFECT IN Cr-Ag GRANULAR FILMS[J]. Journal of Infrared and Millimeter Waves, 2003, 22(1): 31 Copy Citation Text show less
    References

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    [2] Dan Dalacu, Ludvik Martinu. Spectroellipsometric characterization of plasma-deposited Au/SiO2 nanocomposite films. J.Appl.Phys., 2000, 87(1): 228-235

    [3] Simko S J, Cheng Y T, Militello M C. The effects of elevated-temperature on sputter depth profiles of silver nickel bilayers. J.Vac.Sci.Technol A, 1991, 19(3):1477-1481

    [4] Smithells C J, Brandes E A. Smithells Metal Reference Book. 6th edition. London: Butterworth, 1983, 11-12

    [5] Chen L Y, Feng X W, Su Y, et al. Design of a scanning ellipsometer by synchronous rotation of the polarizer and analyzer. Appl.Opt., 1994, 33(7): 1299-1305

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. SIZE EFFECT ON OPTICAL EFFECT IN Cr-Ag GRANULAR FILMS[J]. Journal of Infrared and Millimeter Waves, 2003, 22(1): 31
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