Radiation effects of 0.18 μm CMOS APS by proton irradiation

DOI: 10.3788/IRLA20190433 Cite this Article

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Fig. 1. 4T pixel unit schematic

Fig. 2. Comparison of the dark signal distribution between devices proton pre-and post-irradiation

Fig. 3. Dark signal defect diagram after being irradiated by proton

Fig. 4. 3D figure of dark signal hot pixel before radiation (a) and after radiation (b)

Fig. 5. Proton-induced single event transient bright spot

Fig. 6. Proton-induced single event transient bright cluster (a) and different shape bright lines (b), (c), (d)

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