• Opto-Electronic Engineering
  • Vol. 48, Issue 6, 210071 (2021)
Jing Jianhang1、2, Kong Mingdong2、*, Wang Qiang2, and Guo Chun2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.12086/oee.2021.210071 Cite this Article
    Jing Jianhang, Kong Mingdong, Wang Qiang, Guo Chun. Measurement of absorption loss of optical thin-film by infrared thermal imaging[J]. Opto-Electronic Engineering, 2021, 48(6): 210071 Copy Citation Text show less
    References

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    Jing Jianhang, Kong Mingdong, Wang Qiang, Guo Chun. Measurement of absorption loss of optical thin-film by infrared thermal imaging[J]. Opto-Electronic Engineering, 2021, 48(6): 210071
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